High Quality for Heavy Duty EVA Bags - Low Melt EVA Bags – Zonpak
High Quality for Heavy Duty EVA Bags - Low Melt EVA Bags – Zonpak Detail:
Low melt EVA bags (also called batch inclusion bags) are specially designed packaging bags for rubber ingredients and chemicals used in the rubber and plastic compounding process. The compounding materials can be pre-weighed and temporarily stored in these bags before mixing. Due to the property of low melting point and good compatibility with natural and synthetic rubber, the bags together with the materials inside can be direct put into an internal mixer, and the bags will melt and fully disperse in the rubber or plastic as a minor ingredient.
BENEFITS:
- Assure accurate adding of additives and chemicals
- Make pre-weighing and storing of materials easy
- Provide cleaner mixing area
- Prevent spill loss of additives and chemicals
- Reduce workers’ exposure to the harmful materials
- Leave no packaging waste
APPLICATIONS:
- carbon black, silica (white carbon black), titanium dioxide, anti-aging agent, accelerator, curing agent and rubber process oil
OPTIONS:
- colour, printing, bag tie
SPECIFICATION:
- Material: EVA
- Melting point: 65-110 deg. C
- Film thickness: 30-100 micron
- Bag width: 150-1200 mm
- Bag length: 200-1500mm
Product detail pictures:


Related Product Guide:
"Based on domestic market and expand overseas business" is our improvement strategy for High Quality for Heavy Duty EVA Bags - Low Melt EVA Bags – Zonpak, The product will supply to all over the world, such as: Armenia , Leicester , Florence , The working experience in the field has helped us forged a strong relations with customers and partners both in domestic and international market. For years, our products have been exported to more than 15 countries in the world and have been widely used by customers.

The customer service reprersentative explained very detailed, service attitude is very good, reply is very timely and comprehensive, a happy communication! We hope to have a opportunity to cooperate.
